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AN11009
Pin FMEA for LVC family
Rev. 1 — 4 February 2011 Application note
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Keywords FMEA, LVC, CMOS, 5 V and 3 V systems
Abstract This application note provides a Failure Modes and Effects Analysis
(FMEA) for the device pins of the NXP Semiconductors’ LVC family under
typical failure situations
