herunterladen
1
FEATURES
DCK PACKAGE
(TOP VIEW)
1
6
2
5
V
DD
GND
S0
3
4
V
TT
GTL_REF
S1
DESCRIPTION/ORDERING INFORMATION
SN74GTL3004
www.ti.com
.................................................................................................................................................. SCBS873A – FEBRUARY 2008 – REVISED APRIL 2008
SELECTABLE GTL VOLTAGE REFERENCE
• V
DD
Range: 3.0 V to 3.6 V
• V
TT
Range: 1 V to 1.3 V
• Provides Selectable GTL V
REF
– 0.615 × V
TT
– 0.63 × V
TT
– 0.65 × V
TT
– 0.67 × V
TT
• ± 1% Resistor Ratio Tolerance
• Ambient Temperature Range: – 40 ° C to 85 ° C
• ESD Protection Exceeds the Following Levels
Tests (Tested Per JESD-22):
– 2500-V Human-Body Model
(A114-B, Class II)
– 250-V Machine Model (A115-A)
– 1500-V Charged-Device Model (C101)
The SN74GTL3004 provides for a selectable GTL Voltage Reference (GTL V
REF
). The value of the GTL V
REF
can
be adjusted using S0 and S1 select pins.
The S0 and S1 pins contain glitch-suppression circuitry for excellent noise immunity. When left floating, the S0
and S1 control input pins have 100-k Ω pullups that set the GTL V
REF
default value to the 0.67 × V
TT
ratio
(S0 = 1 and S1 =1).
ORDERING INFORMATION
T
A
PACKAGE
(1) (2)
ORDERABLE PART NUMBER TOP-SIDE MARKING
– 40 ° C to 85 ° C SOT (SC70) – DCK Tape and reel SN74GTL3004DCKR 2TK
(1) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging .
(2) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com .
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2008, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Verzeichnis
