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NB7L216MNEVB Benutzerreferenzhandbuch - ON Semiconductor

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NB7L216MNEVB Benutzerreferenzhandbuch

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© Semiconductor Components Industries, LLC, 2012
February, 2012 Rev. 1
1 Publication Order Number:
EVBUM2085/D
NB7L216MNEVB
NB7L216 Evaluation Board
User's Manual
Description
This document describes the NB7L216 evaluation board
and the appropriate lab test setups. It should be used in
conjunction with the NB7L216 data sheet which contains full
technical details on the device specifications and operation.
The evaluation board is designed to facilitate a quick
evaluation of the NB7L216 GigaCommt High Gain
Differential Receiver/Driver.
Board Layup
The evaluation board is implemented in two layers and
provides a high bandwidth 50 W controlled impedance
environment for higher performance. First layer or primary
trace layer is 5 mils thick Rogers RO6002 material, which
is engineered to have equal electrical length on all signal
traces from NB7L216 device to the sense output. The second
layer is 32 mils thick copper ground plane. For standard lab
setup and test, a split (dual) power supply is required
enabling the 50 ohm impedance in the scope to be used as
termination of the ECL signals (V
TT
= V
CC
– 2.0 V, in split
power supply setup, V
TT
is the system ground).
What measurements can you expect to make?
With this evaluation board, the following measurements
could be performed in singleended
(1)
or differential modes
of operation:
Jitter
Output Skew
Gain/Return Loss
Eye Pattern Generation
Frequency Performance
Output Rise and Fall Time
V
CMR
(Common Mode Range)
1. Singleended measurements can only be made at
V
CC
V
EE
= 3.3 V using this board setup.
Figure 1. NB7L216 Evaluation Board
http://onsemi.com
EVAL BOARD USER’S MANUAL
Verzeichnis

NB7L216MNEVB Datenblatt-PDF

NB7L216MNEVB Benutzerreferenzhandbuch
ON Semiconductor
9 Seiten, 195 KB
NB7L216MNEVB Anwendungshinweis
ON Semiconductor
11 Seiten, 410 KB

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